Engineering, Production & Testing
Products, Materials + Tools
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Jul 22, 2010
Orb Optronix Announces LED Eye Safety Test Services
Orb Optronix has measured commercially available solid state lighting products (SSL) that exceed risk group category RG-1 blue light hazard limits in the ANSI/IESNA RP-27.3-07 ‘Recommended Practice for Photobiological Safety for Lamps, Risk Group Classification and Labeling’ standard along with IEC 62471:2006.
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Jul 23, 2010
New Ocean Optics Light-Measurement Device for Convenient Analysis of LEDs
Jaz from Ocean Optics is a modular, handheld optical-sensing instrument now available for radiometric analysis of LEDs, flat panel displays, lamps and other radiant sources. With its small footprint and convenient onboard display, Jaz is ideal for relative intensity measurements of incandescent, high-intensity discharge, UV curing and fluorescent lamps, as well as low-power sources such as LEDs and OLEDs.
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Jul 23, 2010
LED Lighting Made Easy: LED Engineering Kit on the LLFY Platform
The LED Engineering Kit, which OSRAM Opto Semiconductors is now offering for sale on the LED Light for You (LLFY) platform, provides a means of gaining practical knowledge of LED lighting. This kit is a powerful tool for anyone who wants to test LEDs, various accessories and applications.
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Jul 23, 2010
Instrument Systems Launches Advanced Development of the LumiCam 1300
Fast and reliable display measurements are a challenge in the field of production. The new Gigabit Ethernet interface enables the LumiCam 1300 from Instrument Systems to meet this challenge effortlessly.
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Jul 23, 2010
New Concept for Spectral Measurement: Opsira Spectroradiometer SPR'3
The new conceptional design of our spectral measurement systems aimed at the development of a portable system for absolute spectral emission measurement from UV to NIR.
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Jul 23, 2010
Instrument Systems Launches DTS140 NVIS Display-Test-System
Instrument Systems – leading manufacturer of systems for spectoradiometric light measurement – presents the DTS140 NVIS as the latest generation of the company’s fast, CCD-based spectroradiometers with a proven track record worldwide.
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Jul 26, 2010
Fast & Affordable LED Measurement from Pro-Lite
Pro-Lite Technology LLP (Cranfield, England) has released an LED measurement system, based on Ocean Optic's USB4000 CCD spectrometer, that stands out as being both highly affordable as well as quick and easy to use.
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Jul 26, 2010
LightMtrX Light Metrology Software Platform
Labsphere is the first in the industry to develop commercially viable light test application software, proving its leadership with LightMtrX. LightMtrX software sets the pace for next generation light measurement software in response to your particular needs.
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Jul 29, 2010
New Automation Platform Delivers Uninterrupted LED Production
JP Sercel Associates (JPSA), a world leader in innovative laser micromachining systems and automation technology, announces worldwide shipments of its new Integrated Automation Platform (IAP) to semiconductor and LED manufacturers. The IAP is a high volume production robot dedicated to providing uninterrupted processing of wafers, which lowers LED manufacturing costs.
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Aug 04, 2010
OPTEK Technology’s Lab Delivers Custom LED Test Capabilities for OEMs
Providing design engineers of LED light engines with the ability to perform the precision testing required for uniform color temperature and intensity, TT electronics OPTEK Technology’s LED lab offers a comprehensive range of services and customized testing capabilities for the design and development of solid-state lighting applications.
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Aug 13, 2010
Count On Tools Announces Expanded LED Nozzle Series
Count On Tools Inc., a leading provider of precision components and SMT spare parts, announces the expansion of its LED nozzle series. By working closely with the LED component manufacturers, Count On Tools guarantees secure picking of all fragile components and accurate placement on circuit boards.
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Aug 13, 2010
Konika Minolta Releases Successor of Established Hand-held Chroma Meter: The CL-200A
Konica Minolta Sensing, Inc. announces the introduction of the new lightweight portable Chroma Meter CL-200A suitable for measuring the colour temperature of white LEDs and other Light sources. The CL-200A is the successor to the current CL-200 Chroma Meter.
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Jul 23, 2010
Monocrystal Launched Ultra-Large 8” Sapphire Wafers for LEDs
Monocrystal, a leader in the synthetic sapphire and other advanced electronic materials markets, announced today that the company launched production of its ultra-large 8” C-plane epi-ready sapphire wafers for LED manufacturing in August.
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Jul 26, 2010
TDI announces the release of new InGaN substrates for light emitting devices
Technologies and Devices International, Inc. (TDI), the leading developer and supplier of compound nitride semiconductor materials, today announces availability of the world’s first InGaN substrate materials. InGaN is the key compound semiconductor material used for the fabrication of GaN-based ultra violet (UV), blue, green, and white light emitting diodes (LEDs) and blue laser diodes (LDs). InGaN materials serve as the light emitting regions of these light-emitting devices and determine device parameters including efficiency, light output power and lifetime. InGaN substrates are needed to provide material match for InGaN-based device epitaxial structures and to boost device performance.
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Aug 26, 2010
Labsphere's TOCS LED Measurement System Conforms to LM-79 and LM-80 with Single Instrument
To more easily meet new reporting specifications, Labsphere’s new Thermal/Optical/Electrical LED Measurement Systems (TOCS) enables measurement of optical properties as a function of temperature and operating current using a single instrument. The TOCS complies with IESNA LM-79 and LM-80 standards, delivering accurate and reproducible LED measurements.
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Aug 31, 2010
Cree Demonstrates High Quality 150-mm Silicon Carbide Substrates
Cree, Inc. announced today that it has achieved a major breakthrough in the development and wide scale commercialization of silicon carbide (SiC) technology with the demonstration of high quality, 150-mm SiC substrates with micropipe densities of less than 10/cm2. The current Cree standard for SiC substrates is 100-mm diameter material.
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Sep 14, 2010
Selective Radiation Soldering For Flex-Circuits
Essemtec Switzerland introduces a new solution for soldering heat-sensitive, flexible materials such as Mylar ― a selective IR oven. The principle: the specifically selected wavelength of the IR radiation is absorbed by the solder joint but not by the foil.
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Sep 23, 2010
Konica Minolta Sensing Americas and B&W Tek Inc Announce SpectraRad™ Irradiance Meter
Konica Minolta Sensing Americas, Inc. (KMSA), the worldwide leader in the industrial measurement of color, light and shape has partnered with B&W Tek, Inc. an advanced instrumentation company producing optical spectroscopy and laser systems to introduce a new, lower cost option for LED characterization.
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Oct 19, 2010
Eulitha Unveils New Photolithography Technology for Photonics Patterning, Called PHABLE
Eulitha AG, a Swiss based nanolithography company, has developed a proprietary photolithography technology for low-cost and high-throughput fabrication of photonic nanostructures. This solves a major ongoing problem faced in the fabrication of high-resolution photonic structures since standard photolithography equipment either lacks the required resolution or its cost is prohibitively high. The patented technology enables the formation of periodic nanostructures over large areas for such applications as LEDs, solar cells and flat-screen displays.
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Nov 05, 2010
USHIO America - World's First 6-Inch Full-Field Projection Exposure System for Manufacturing LED Chips
USHIO America, a leading provider of specialty and general illumination lighting solutions as a wholly owned subsidiary of USHIO Inc, today announced that the company has started marketing the world’s first 6-inch full-field projection exposure system for manufacturing LED chips in the US.
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