It is well known that modern III-nitride based technologies for light emitting diode (LED) production include (as an initial inevitable step) the preparation of GaN templates. Such GaN templates are usually delivered on foreign substrates possessing high lattice mismatch with respect to GaN layers, e.g., sapphire or silicon carbide substrates. The growth of GaN layers on highly mismatched substrates occurs via the formation of 3D islands with their following coalescence [1]. Such growth mode results in an extremely high density of threading dislocations (TDs) up to 1010–1011 cm–2 in the layer interior [1]. These TDs are known as main sources for the deleterious performance of LEDs and other GaN based electronic and optoelectronic devices [2]. Therefore there exists an ultimate necessity in the developing of effective and low-cost recipes for low TD density GaN template manufacturing.Read more »
Optics for use with Light Emitting Diodes are described. Microstructured optics are available and customizable for a wide variety of applications. A few of these will be touched on. A methodology of designing these optics and the photometrics of the typical technology is overviewed. Read more »